Literature regarding the subjects of our site

Scanning Electron Microscopy in general
EDX analysis
WDX analysis
Applications within the material science and technique
Applications within the geosciences

Scanning Electron Microscopy in general

GLAUERT, A.M. (1974): Practical methods in electron microscopy. Vol.II. - (Elsevier).

GOLDSTEIN, J.I.; NEWBURY, D.E.; ECHLIN, P.; JOY, D.C.; FIORI, C. & LIFSHIN, E. (1992): Scanning electron microscopy and x-ray microanalysis. - 2nd ed., 820 pp., New York (Plenum Press).
comprehensive publication, standard

GOODHEW, P.J. & HUMPHREYS, F.J. (1988): Electron microscopy and analysis. - XII + 232 pp., London (Taylor & Francis).

JOY, D.C. (1975): The observation of crystalline materials in the scanning electron microscope (SEM). - J. Microsc., 103, 1-23. KAY, D.H. (1965): Techniques for electron microscopy. - 2nd ed., XIV+560 pp., Oxford (Blackwell).

LYMAN, C. E. (1990): Scanning electron microscopy, X-ray microanalysis and analytical electron microscopy. A laboratory workbook. - XI, 407 S., New York (Plenum Press).
good presentation of all techniques

MALIN, D.F. (1975): Photographic aspects of scanning electron microscopy. - J. Microsc., 103, 79-87.

POSTEK, M.T.; HOWARD, K.S.; JOHNSON, A.H. & McMICHAEL, K.L.: Scanning electron microscopy.

REIMER, L. (1985): Scanning electron microscopy. Physics of image formation and microanalysis. - XVIII+457 pp., Berlin (Springer).

WATT, I.M. (1985): The principles and practice of electron microscopy.- VIII + 303 pp., Cambridge (Cambridge University Press).
good summary

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EDX analysis

DUNHAM, A.C. & WILKINSON, F.C.F. (1978): Accuracy, precision and detection limits of energy-dispersive electron-microprobe analysis of silicates. - X-ray spectrom., 7, 50-55.

RUSS, J.C. (1984): Fundamentals of energy-dispersive X-ray analysis.- London (Butterworths).

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WDX analysis

ALBEE, A.L. & RAY, L. (1970): Correction factors for electron probe microanalysis of silicates, oxides, carbonates, phosphates, and sulfates. - Anal. Chem., 42, 1408-1414.

BASTIN, G.F. & HEIJLIGERS, H.J.M. (1991): Quantitative electron probe microanalysis of nitrogen. - Scanning, 13, 325- 342.

CLIFF, G. & LORIMER, G.W. (1975): The quantitative analysis of thin specimens. - J. Microsc., 103, 203-207.

DROOP, G.T.R. (1987): A general equation for estimating Fe3+ concentrations in ferromagnesian silicates and oxides from microprobe analyses, using stochiometric criteria. - Mineralogical Magazine, 51, 431-435.

FIALIN, M. (1988): Modification of Philibert-Tixier ZAF correction for geological samples. - X-ray spectrom., 17, 103-106.

GOODHEW, P.J. & GULLEY, J.E.C. (1975): The determination of alkali metals in glasses by electron microprobe analysis. - Glass Technol., 15, 123-126.

HARRIS, D.E. (1990): Electron-microprobe analysis. - In: Advanced microscopic studies of ore minerals (J.L LAMBOR & D.J VAUGHAN eds.), Mineral. Assoc. Canada Short Course Handbook, 17, 319-339, Ottawa.

HEINRICH, K.F.J. & NEWBURY, D.E. (1991): Electron probe quantification. - New York (Plenum Press).

HREN, J.J.; GOLDSTEIN, J.I. & JOY, D.C. (1979): Introduction to analytical electron microscopy. - New York (Plenum Press).

JOY, D.C.; ROMIG, A.D. & GOLDSTEIN, J.I. (1986): Principles of analytical electron microscopy. - New York (Plenum Press).

KERRICK, D.M.; EMINHIZER, L.B. & VILLAUME, J.F. (1973): The role of carbon film thickness in electron microprobe analysis. - Amer. Mineral., 79, 745-749.

LAFLAMME, J.H.G. (1990): The preparation of materials for microscopic study. - In: Advanced microscopic studies of ore minerals (J.L LAMBOR & D.J VAUGHAN eds.), Mineral. Assoc. Canada Short Course Handbook, 17, 37-68, Ottawa.

LANE, S.J. & DALTON, J.A. (1994): Electron microprobe analysis of geological carbonates. - Amer. Mineral., 79, 745- 749.

LLOYD, G.E.; SCHMIDT, N.-H.; MAINPRICE, D. & PRIOR, D.J. (1991): Crystalline textures. - Mineral. Mag, 55, 331-345.

LOHNES, R.A. & DEMIREL, T. (1978): SEM applications in soil mechanics. - Scann. Electron Microsc., 1978/I, 643-654.

MARINENKO, R.B.; MYKLEBUST, R.L.; BRIGHT, D.S. & NEWBURY, D.E. (1987): Digital X-ray compositional mapping with "standard map" corrections for wavelength-dispersive spectrometer defocusing. - J. Microsc., 145, 207-223.

MORGAN, A.J.: X-ray microanalysis in electron microscopy for biologists. - The royal Microcopical Society laboratory series of handbooks on microscopy.

PETRUK, W. (1988): The capabilities of the microprobe Kontron image analysis system: application to mineral benefication. - Scann. Microsc.,2, 1247-1256.

POTTS, P.J.; BOWLES, J.F.W.; REED, S.J.B. & CAVE, M.R. (1995): Microprobe techniques in the earth sciences. - The Miner. Soc. Series, 6, XII + 419 pp., London (Chapman Hall).

POTTS, P.J.; TINDLE, A.G. & ISAACS, M.C. (1983): On the precision of electron microprobe data: a new test for the homogeneity of mineral standards. - Amer. Mineral., 68, 1237-1242.

POTTS, P.J.; TINDLE, A.G. & STANFORD, D. (1995): A new procedure for relocating mineral grains for microprobe analysis. - Mineralogical Magazine, 59, 221-228.

POTTS, P.J. & TINDLE, A.G. (1991): Evaluation of spectrum overlap correction in energy-dispersive X-ray spectrometry using the digital filter deconvolution procedure: application to selected interferences encountered in the microprobe analysis of minerals. - X-ray Spectrom., 20, 119-129.

PURVIS, K. (1991): Fibrous clay mineral collapse produced by beam during scanning electron microscopy. - Clay Minerals, 26, 141-145.

REED, S.J.B. & WARE, N.G: (1975): Quantitative electron microprobe analysis of silicates using energy-dispersive X-ray spectrometry. - J.Petrol., 16, 499-519.

REED, S.J.B. (1990): Fluorescence effects in quantitative microprobe analysis. - In: Microbeam analysis (D.B. WILLIAMS; P. INGRAM & J. MICHAEL eds.), 109-114, San Francisco (San Francisco Press).

REED, S.J.B. (1993): Electron microprobe analysis. - 2. ed., XVIII, 326 S., Cambridge (Cambridge University Press).

REED, S.J.B. (1996): Electron microprobe analysis and scanning electron microscopy in geology. - XII, 201 S., Cambridge (Cambridge Univ. Press).
good standard publication

RICHARD, L.R. & CLARKE, D.B. (1990): AMPHIBOL: A program for calculating structural formulae and for classifying and plotting chemical analyses of amphiboles. - Amer. Mineral., 75, 421-423.

ROBINSON, W.E.; CUTMORE, N.G. & BURDON, R.G. (1984): Quantitative compositional analysis using a backscattered electron signal in a scanning electron microscope. - Scann. Electron Microsc., 1984/II, 483-492.

RUCKLIDGE, J.C.; GIBB, F.G.F.; FAWCETT, J.J. & GASPARINNI, E.L.(1970): Rapid rock analysis by electron microprobe. - Geochim. Cosmochim. Acta, 34, 243-247.

SAIMOTO, S.; HELMSTAEDT, H.; KEMPSON. D. & SCHULSON, E.M. (1980): Electron chanelling and its potential for petrographic studies. - Canad. Mineral., 18, 251- 259.

SCOTT, V.D.; LOVE, G. & REED, S.J.B. (1995): Quantitative electron probe microanalysis. - 2. ed., XIV, 311 S., New York (Ellis Horwood).

SMELLIE, J.A.T. (1972): Preparation of glass standards for the use in X-ray microanalysis. - Mineralogical Magazine, 38, 614-617.

WARE, N.G. (1991): Combined energy-dispersive-wavelength- dispersive quantitative electron microprobe nalysis. - X-ray Spectrom., 20, 73-79.

WICKS, F.J. & PLANT, A.G. (1983): The accuracy and precision of routine energy-dispersive electron microprobe analysis of serpentine. - X-ray Spectrom., 12, 59-66.

WILLIAMS, D.B.; INGRAM, P. & MICHAEL, J. eds. (1990): Microbeam analysis. - San Francisco (San Francisco Press).

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Applications within the material science and technique

THOMPSON-RUSSELL, K.C. & EDINGTON, J.W. (1977): Electron microscope specimen preparation techniques in material science. - Monographs in Practical Electron microscopy in Material Science.

YACOBI, B.G. ed. (1994): Microanalysis of solids. - XIII, 460 S., New York (Plenum Press).

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Applications within the geosciences

BEUTELSPACHER, H. & van der MAREL, H.W. (1968): Atlas of electron microscopy of clay minerals and their admixtures - A picture atlas . - 333 pp., Amsterdam (Elsevier).

GOLUBIC, S.; BRENT, G. & LECAMPION, T. (1975): Scanning electron microscopy of endolithic algae and fungi using a multipurpose casting-embedding technique. - Lethaia, 3, 203-209, Oslo.

JORDAN, P.G.; DÜGGELIN, M.; MATHYS, D. & GUGGENHEIM, R. (1991): Gypsum-anhydrite differentiation by SEM using the back-scattered electron signal. - J. Sediment. Petrol., 61, 616-618.

LINDÉ, Krister (1984): Scanning electron microscope studies of different sands and silts. - Acta Universitatis Upsaliensis (Abstr. of Uppsala diss. from the Faculty of Science), 748, 1-10, Uppsala.

McHARDY, W.J. & BIRNIE, A.C. (1987): Scanning electron microscopy.- In: A handbook of determinative methods in clay mineralogy (M.J.WILSON ed.), 173-208, Glasgow (Blackie).

NADEAU, P.H. & HURST, A. (1991): Application of back-scattered electron microscopy to the quantification of clay mineral microporosity in sandstones. - J. Sediment. Petrol., 61, 616-618.

SMART, & TOVEY, N.K. (1981): Electron microscopy of soils and sediments - examples. - 178 pp., Oxford (Clarendon Press).

SMART, P. & TOVEY, N.K. (1982): Electron microscopy of soils and sediments: Techniques. - Oxford (Oxford Univ. Press).

TREWIN, N.H. (1988): Use of the scanning electron microscope in sedimentology. - In: Techiques in sedimentology (M. TUCKER ed.), 229-273, Oxford (Blackwell).
quick, profound survey

WILSON, M.D. & E.D. PITTMAN (1977): Authigenic clays in sandstone. - recognition and influence on reservoir properties and paleoenvironmental analysis. - J. Sediment. Petrol., 47, 1, 3-31.